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Multi-Parameter Scattering Sensor and MethodsMethods, detectors and systems detect particles and/or measure particle properties. According to one embodiment, a detector for detecting particles comprises: a sensor for receiving radiation scattered by an ensemble of particles; and a processor for determining a physical parameter for the detector, or an optimal detection angle or a bound for an optimal detection angle, for measuring at least one moment or integrated moment of the ensemble of particles, the physical parameter, or detection angle, or detection angle bound being determined based on one or more of properties (a) and/or (b) and/or (c) and/or (d) or ranges for one or more of properties (a) and/or (b) and/or (c) and/or (d), wherein (a)-(d) are the following: (a) is a wavelength of light incident on the particles, (b) is a count median diameter or other characteristic size parameter of the particle size distribution, (c) is a standard deviation or other characteristic width parameter of the particle size distribution, and (d) is a refractive index of particles.
Document ID
20160008429
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Greenberg, Paul S.
Fischer, David G.
Date Acquired
July 5, 2016
Publication Date
June 28, 2016
Subject Category
Space Radiation
Report/Patent Number
Patent Number: US-Patent-9,377,481
Patent Application Number: US-Patent-Appl-SN-13/134,959
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-9,377,481
Patent Application
US-Patent-Appl-SN-13/134,959
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