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By-Pass Diode Temperature Tests of a Solar Array Coupon under Space Thermal Environment ConditionsBy-Pass diodes are a key design feature of solar arrays and system design must be robust against local heating, especially with implementation of larger solar cells. By-Pass diode testing was performed to aid thermal model development for use in future array designs that utilize larger cell sizes that result in higher string currents. Testing was performed on a 56-cell Advanced Triple Junction solar array coupon provided by SSL. Test conditions were vacuum with cold array backside using discrete by-pass diode current steps of 0.25 A ranging from 0 A to 2.0 A.
Document ID
20160008885
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Wright, Kenneth H.
(Alabama Univ. Huntsville, AL, United States)
Schneider, Todd A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Vaughn, Jason A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Hoang, Bao
(Space Systems/Loral Palo Alto, CA, United States)
Wong, Frankie
(Space Systems/Loral Palo Alto, CA, United States)
Wu, Gordon
(Space Systems/Loral Palo Alto, CA, United States)
Date Acquired
July 8, 2016
Publication Date
June 5, 2016
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
M16-5274
Report Number: M16-5274
Meeting Information
Meeting: IEEE Photovoltaic Specialists Conference
Location: Portland, OR
Country: United States
Start Date: June 5, 2016
End Date: June 10, 2016
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.
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