NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Dopant Selective Reactive Ion Etching of Silicon CarbideA method for selectively etching a substrate is provided. In one embodiment, an epilayer is grown on top of the substrate. A resistive element may be defined and etched into the epilayer. On the other side of the substrate, the substrate is selectively etched up to the resistive element, leaving a suspended resistive element.
Document ID
20160012002
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Okojie, Robert
Date Acquired
October 4, 2016
Publication Date
September 27, 2016
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-13/561,359
Patent Number: US-Patent-9,452,926
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-9,452,926
Patent Application
US-Patent-Appl-SN-13/561,359
No Preview Available