Spectralon BRDF and DHR Measurements in Support of Satellite Instruments Operating Through Shortwave InfraredSatellite instruments operating in the reflective solar wavelength region require accurate and precise determination of the Bidirectional Reflectance Distribution Functions (BRDFs) of the laboratory and flight diffusers used in their pre-flight and on-orbit calibrations. This paper advances that initial work and presents a comparison of spectral Bidirectional Reflectance Distribution Function (BRDF) and Directional Hemispherical Reflectance (DHR) of Spectralon*, a common material for laboratory and onorbit flight diffusers. A new measurement setup for BRDF measurements from 900 nm to 2500 nm located at NASA Goddard Space Flight Center (GSFC) is described. The GSFC setup employs an extended indium gallium arsenide detector, bandpass filters, and a supercontinuum light source. Comparisons of the GSFC BRDF measurements in the ShortWave InfraRed (SWIR) with those made by the NIST Spectral Trifunction Automated Reference Reflectometer (STARR) are presented. The Spectralon sample used in this study was 2 inch diameter, 99% white pressed and sintered Polytetrafluoroethylene (PTFE) target. The NASA/NIST BRDF comparison measurements were made at an incident angle of 0 deg and viewing angle of 45 deg. Additional BRDF data not compared to NIST were measured at additional incident and viewing angle geometries and are not presented here The total combined uncertainty for the measurement of BRDF in the SWIR range made by the GSFC scatterometer is less than 1% (k=1). This study is in support of the calibration of the Joint Polar Satellite System (JPSS) Radiation Budget Instrument (RBI) and Visible Infrared Imaging Radiometer Suite (VIIRS) of and other current and future NASA remote sensing missions operating across the reflected solar wavelength region.
Document ID
20160012288
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Georgiev, Georgi T. (NASA Langley Research Center Hampton, VA, United States)
Butler, James J. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Thome, Kurt (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Cooksey, Catherine (National Inst. of Standards and Technology Gaithersburg, MD, United States)
Ding, Leibo (Science Systems and Applications, Inc. Lanham, MD, United States)
Date Acquired
October 12, 2016
Publication Date
September 26, 2016
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
NF1676L-25451Report Number: NF1676L-25451
Meeting Information
Meeting: SPIE Remote Sensing 2016 Conference
Location: Edinburgh
Country: United Kingdom
Start Date: September 26, 2016
End Date: September 29, 2016
Sponsors: International Society for Optical Engineering