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Compendium of Single Event Effect Results from NASA Goddard Space Flight CenterWe present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Document ID
20160013225
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Obryan, Martha V. (ASRC Aerospace Corp. Greenbelt, MD, United States)
Label, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Szabo, Carl M. (ASRC Aerospace Corp. Greenbelt, MD, United States)
Chen, Dakai (NASA Goddard Space Flight Center Greenbelt, MD United States)
Campola, Michael J. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Casey, Megan C. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD United States)
Wilcox, Edward P. (ASRC Aerospace Corp. Greenbelt, MD, United States)
Ladbury, Raymond L. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Ikpe, Stanley A. (NASA Langley Research Center Hampton, VA, United States)
Pellish, Jonathan A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Berg, Melanie D. (ASRC Aerospace Corp. Greenbelt, MD, United States)
Date Acquired
November 2, 2016
Publication Date
July 11, 2016
Subject Category
Spacecraft Design, Testing And Performance
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN35503
Meeting Information
Meeting: Nuclear and Space Radiation Effects Conference (NSREC), Radiation Effects Data Workshop
Location: Portland, OR
Country: United States
Start Date: July 11, 2016
End Date: July 15, 2016
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
digital
Single Event Effects (SEE)
spacecraft electronics
space radiation reliability
hybrid devices
linear bipolar

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