NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Compendium of Single Event Effects (SEE) Test Results for COTS and Standard Electronics for Low Earth Orbit and Deep Space ApplicationsWe present the results of SEE testing with high energy protons and with low and high energy heavy ions. This paper summarizes test results for components considered for Low Earth Orbit and Deep Space applications.
Document ID
20170000804
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Reddell, Brandon (NASA Johnson Space Center Houston, TX, United States)
Bailey, Chuck (NASA Johnson Space Center Houston, TX, United States)
Nguyen, Kyson (Jacobs Technology, Inc. Houston, TX, United States)
O'Neill, Patrick (NASA Johnson Space Center Houston, TX, United States)
Gaza, Razvan (Lockheed Martin Corp. Houston, TX, United States)
Patel, Chirag (Lockheed Martin Corp. Houston, TX, United States)
Cooper, Jaime (Lockheed Martin Corp. Houston, TX, United States)
Kalb, Theodore (Lockheed Martin Corp. Houston, TX, United States)
Date Acquired
January 25, 2017
Publication Date
July 17, 2017
Subject Category
Electronics And Electrical Engineering
Spacecraft Instrumentation And Astrionics
Report/Patent Number
JSC-CN-38474
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.

Related Records

IDRelationTitle20170006885See AlsoCompendium of Single Event Effects Test Results for Commercial Off-The-Shelf and Standard Electronics for Low Earth Orbit and Deep Space Applications20170005730See AlsoCompendium of Single Event Effects Test Results for Commercial Off-The-Shelf and Standard Electronics for Low Earth Orbit and Deep Space Applications
No Preview Available