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Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment DataWe propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.
Document ID
20170002430
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie (ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD United States)
Xapsos, Michael (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
March 23, 2017
Publication Date
March 20, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN39959
Report Number: GSFC-E-DAA-TN39959
Meeting Information
Meeting: GOMAC Tech 2017 Government Microcircuits Applications and Critical Technologies Conference
Location: Reno, NV
Country: United States
Start Date: March 20, 2017
End Date: March 23, 2017
Sponsors: Department of Defense
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Application Specific Integrated Circuit (ASIC)
Single Event Upsets (SEUs)
Field Programmable Gate Array (FPGA)

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