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Proton Testing: Opportunities, Pitfalls and PuzzlesAlthough proton SEE testing can place constraints on some heavy-ion SEE susceptibilities, it is important to quantify residual risk that protons may not reveal all SEE susceptibilities in a system. We examine the relative strengths and limitations of proton and heavy-ion SEE testing and how these may be affected by technology scaling and high-Z materials in the device.
Document ID
20170004732
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Ladbury, Raymond
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
May 25, 2017
Publication Date
May 22, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN42480
Report Number: GSFC-E-DAA-TN42480
Meeting Information
Meeting: Single Event Effects (SEE) Symposium - Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
Location: La Jolla, CA
Country: United States
Start Date: May 22, 2017
End Date: May 25, 2017
Sponsors: See Symposium (Single Event Effects)
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
Protons
Hardness Assurance
Single-Event Effects
SEE testing
Heavy-Ions
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