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Characterization of System on a Chip (SoC) Single Event Upset (SEU) Responses Using SEU Data, Classical Reliability Models, and Space Environment DataWe propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.
Document ID
20170004737
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie (ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD United States)
Xapsos, Michael (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
May 25, 2017
Publication Date
May 22, 2017
Subject Category
Statistics And Probability
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN42794
Report Number: GSFC-E-DAA-TN42794
Meeting Information
Meeting: Single Event Effects (SEE) Symposium and Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
Location: Reno, NV
Country: United States
Start Date: May 22, 2017
End Date: May 25, 2017
Sponsors: See Symposium (Single Event Effects)
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single Event Upsets (SEUs)
Application Specific Integrated Circuit (ASIC)
Field Programmable Gate Array (FPGA); Application Specific Integrated Circuit (A

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