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Characterization of System Level Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment DataWe propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.
Document ID
20170005807
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie (ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD United States)
Xapsos, Michael (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
June 28, 2017
Publication Date
June 26, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN43724
Report Number: GSFC-E-DAA-TN43724
Meeting Information
Meeting: NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: United States
Start Date: June 26, 2017
End Date: June 29, 2017
Sponsors: NASA Headquarters
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Field Programmable Gate Array (FPGA); Application Specific Integrated Circuit (A

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