Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Austin, Rebekah (NASA Goddard Space Flight Center Greenbelt, MD United States) Label, Ken A. (NASA Goddard Space Flight Center Greenbelt, MD United States) Sampson, Mike J. (NASA Goddard Space Flight Center Greenbelt, MD United States) Evans, John (NASA Headquarters Washington, DC United States) Witulski, Art (Vanderbilt Univ. Nashville, TN, United States) Sierawski, Brian (Vanderbilt Univ. Nashville, TN, United States) Karsai, Gabor (Vanderbilt Univ. Nashville, TN, United States) Mahadevan, Nag (Vanderbilt Univ. Nashville, TN, United States) Schrimpf, Ron (Vanderbilt Univ. Nashville, TN, United States) Reed, Robert A. (Cornell Technical Services, LLC Columbia, MD, United States) Date Acquired
August 3, 2017
Publication Date
July 17, 2017
Subject Category
Electronics And Electrical Engineering Report/Patent Number
GSFC-E-DAA-TN44765Report Number: GSFC-E-DAA-TN44765 Meeting Information
Meeting: 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017)
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNL15AA02B
CONTRACT_GRANT: NNX14AN61A
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single event effects spacecraft electronics space radiation reliability