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An Improved SEL Test of the ADV212 Video CodecSingle-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latch-up (SEL) protection circuitry.
Document ID
20170007321
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Wilcox, Edward P. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Campola, Michael J. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Nadendla, Seshagiri (Jackson and Tull, Inc. Seabrook, MD, United States)
Kadari, Madhusudhan (Jackson and Tull, Inc. Seabrook, MD, United States)
Gigliuto, Robert A. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
August 3, 2017
Publication Date
July 17, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN44790
Report Number: GSFC-E-DAA-TN44790
Meeting Information
Meeting: 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017)
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG12CR31C
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single-event effect (SEE); microelectronic devices; single-event latchup (SEL)

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