NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Novel High Temperature Capacitive Pressure Sensor Utilizing SiC Integrated Circuit Twin Ring OscillatorsThis paper describes initial development and testing of a novel high temperature capacitive pressure sensor system. The pressure sensor system consists of two 4H-SiC 11-stage ring oscillators and a SiCN capacitive pressure sensor. One oscillator has the capacitive pressure sensor fixed at one node in its feedback loop and varies as a function of pressure and temperature while the other provides a pressure-independent reference frequency which can be used to temperature compensate the output of the first oscillator. A two-day repeatability test was performed up to 500C on the oscillators and the oscillator fundamental frequency changed by only 1. The SiCN capacitive pressure sensor was characterized at room temperature from 0 to 300 psi. The sensor had an initial capacitance of 3.76 pF at 0 psi and 1.75 pF at 300 psi corresponding to a 54 change in capacitance. The integrated pressure sensor system was characterized from 0 to 300 psi in steps of 50 psi over a temperature range of 25 to 500C. The pressure sensor system sensitivity was 0.113 kHzpsi at 25C and 0.026 kHzpsi at 500C.
Document ID
20170007829
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Scardelletti, M.
(NASA Glenn Research Center Cleveland, OH United States)
Neudeck, P.
(NASA Glenn Research Center Cleveland, OH United States)
Spry, D.
(NASA Glenn Research Center Cleveland, OH United States)
Meredith, R.
(NASA Glenn Research Center Cleveland, OH United States)
Jordan, J.
(NASA Glenn Research Center Cleveland, OH United States)
Prokop, N.
(NASA Glenn Research Center Cleveland, OH United States)
Krasowski, M.
(NASA Glenn Research Center Cleveland, OH United States)
Beheim, G.
(NASA Glenn Research Center Cleveland, OH United States)
Hunter, G.
(NASA Glenn Research Center Cleveland, OH United States)
Date Acquired
August 18, 2017
Publication Date
May 30, 2017
Subject Category
Space Transportation And Safety
Report/Patent Number
GRC-E-DAA-TN43036
Report Number: GRC-E-DAA-TN43036
Meeting Information
Meeting: 2017 IEEE Electroncs and Components Technology Conference (ECTC 2017)
Location: Orlando, FL
Country: United States
Start Date: May 30, 2017
End Date: June 2, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: WBS 811073.02.42.01.12
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
high temperature
ring oscillator
SiCN capacitive pressure sensor
silicon carbide
No Preview Available