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Single Event Effect Testing of the Micron MT46V128M8The Micron MT46V128M8 was tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in June of 2017. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI) and possible soft data errors classified as single event upsets (SEU).
Document ID
20170009469
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Stansberry, Scott (ASRC Federal Space and Defense Greenbelt, MD, United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Wilcox, Ted (ASRC Federal Space and Defense Greenbelt, MD, United States)
Seidleck, Christina (ASRC Federal Space and Defense Greenbelt, MD, United States)
Phan, Anthony (ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
October 4, 2017
Publication Date
September 30, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN46255
Report Number: GSFC-E-DAA-TN46255
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single Event Functional Interrupts (SEFI)
Double-Data-Rate (DDR)
Single-Event Effects (SEE)

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