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Field Programmable Gate Array Failure Rate Estimation Guidelines for Launch Vehicle Fault Tree ModelsToday's launch vehicles complex electronic and avionics systems heavily utilize Field Programmable Gate Array (FPGA) integrated circuits (IC) for their superb speed and reconfiguration capabilities. Consequently, FPGAs are prevalent ICs in communication protocols such as MILSTD- 1553B and in control signal commands such as in solenoid valve actuations. This paper will identify reliability concerns and high level guidelines to estimate FPGA total failure rates in a launch vehicle application. The paper will discuss hardware, hardware description language, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC. The hardware description language portion will discuss the high level FPGA programming languages and software/code reliability growth. The radiation portion will discuss FPGA susceptibility to space environment radiation.
Document ID
20170012420
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Al Hassan, Mohammad
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Britton, Paul
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Hatfield, Glen Spencer
(Bastion Technologies, Inc. El Camino, TX, United States)
Novack, Steven D.
(Bastion Technologies, Inc. El Camino, TX, United States)
Date Acquired
December 19, 2017
Publication Date
October 18, 2017
Subject Category
Launch Vehicles And Launch Operations
Electronics And Electrical Engineering
Systems Analysis And Operations Research
Report/Patent Number
M17-6262
Report Number: M17-6262
Meeting Information
Meeting: International Association for the Advancement of Space Safety (IAASS) Conference
Location: Toulouse
Country: France
Start Date: October 18, 2017
End Date: October 20, 2017
Sponsors: International Association for the Advancement of Space Safety
Distribution Limits
Public
Copyright
Public Use Permitted.
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