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Field Programmable Gate Array Reliability Analysis Guidelines for Launch Vehicle Reliability Block DiagramsField Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic components in today's sophisticated launch and space vehicle complex avionic systems, largely due to their superb reprogrammable and reconfigurable capabilities combined with relatively low non-recurring engineering costs (NRE) and short design cycle. Consequently, FPGAs are prevalent ICs in communication protocols and control signal commands. This paper will identify reliability concerns and high level guidelines to estimate FPGA total failure rates in a launch vehicle application. The paper will discuss hardware, hardware description language, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC. The hardware description language portion will discuss the high level FPGA programming languages and software/code reliability growth. The radiation portion will discuss FPGA susceptibility to space environment radiation.
Document ID
20170012468
Acquisition Source
Marshall Space Flight Center
Document Type
Abstract
Authors
Al Hassan, Mohammad
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Britton, Paul
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Hatfield, Glen Spencer
(Bastion Technologies, Inc. El Camino, TX, United States)
Novack, Steven D.
(Bastion Technologies, Inc. El Camino, TX, United States)
Date Acquired
December 20, 2017
Publication Date
November 8, 2017
Subject Category
Launch Vehicles And Launch Operations
Computer Programming And Software
Report/Patent Number
M17-6351
Report Number: M17-6351
Meeting Information
Meeting: RAM X Training Summit
Location: Huntsville, AL
Country: United States
Start Date: November 8, 2017
End Date: November 9, 2017
Sponsors: Society of Reliability Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.
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