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Proton Irradiation of the 16GB Intel Optane SSDThe purpose of this test is to assess the single event effects (SEE) and radiation susceptibility of the Intel Optane Memory device (SSD) containing the 3D Xpoint phase change memory (PCM) technology. This test is supported by the NASA Electronics Parts and Packaging Program (NEPP).
Document ID
20180000932
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Wyrwas, E. J. (Lentech, Inc. Greenbelt, MD, United States)
Date Acquired
February 5, 2018
Publication Date
November 6, 2017
Subject Category
Electronics And Electrical Engineering
Computer Operations And Hardware
Report/Patent Number
GSFC-E-DAA-TN49014
Report Number: GSFC-E-DAA-TN49014
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single-Event Effects (SEE)
Solid State Drive (SSD
Proton testing

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