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Interpreting Space-Mission LET Requirements for SEGR in Power MOSFETsSingle-event gate rupture (SEGR) is a potentially catastrophic failure mechanism of power MOSFETs biased in the off-state. In part due to the severity of-SEGR consequences and in part due to the difficulty of accurated SEGR rate estimation, SEGR mitigation me1hodologies emphasize risk avoidance, using heavy-ion accelerator testing to define safe operating conditions for a surface-incident linear energy transfer {LET). This "safe-operating area" (SOA) within which the device may be biased without experiencing SEGR is then often derated by a prescribed factor to ensure low risk of SEGR. Although research in 1996 indicated that such LET-based SEGR hardness requiremen1s could provide false assurance of safe operation unless one also considered· ion energy], most mission SEGR requirements are still specified in terms of surface-incident LET. Moreover, terrestrial SEGR tests at a given surface-incident LET are limited by the small number of ion species and energies available at heavy-ion accelerators. In comparison, the on-orbit radiation environment is composed of all of the naturally-occurring elements with peak fluxes at nearly GeV/nucleon energies. The primary objective of this study is to examine whether typical derating of high-energy heavy-ion accelerator test data bounds the risk for SEGR from higher-energy on-orbit ions with the mission LET requirement.
Document ID
20180001186
Document Type
Presentation
Authors
Lauenstein, Jean-Marie
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Goldsman, Neil
(Maryland Univ. College Park, MD, United States)
Kim, Hak
(MEI Technologies, Inc. Greenbelt, MD, United States)
Batchelor, David
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Phan, Anthony
(MEI Technologies, Inc. Greenbelt, MD, United States)
Date Acquired
February 13, 2018
Publication Date
July 19, 2010
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
LEGNEW-OLDGSFC-GSFC-LN-1147
Meeting Information
Institute of Electrical and Electronics Engineers (IEEE) Nuclear and Space Radiation Effects Conference (NSREC)(Denver, CO)
Distribution Limits
Public
Copyright
Public Use Permitted.

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