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Standardizing GPU Radiation Test Approaches - Part 2A standardized test method has been created to characterize and stress graphics processing units (GPU) during radiation effects testing.
Document ID
20180003141
Acquisition Source
Goddard Space Flight Center
Document Type
Poster
External Source(s)
https://nepp.nasa.gov/
Authors
Wyrwas, Edward J. (Lentech, Inc. Greenbelt, MD, United States)
Szabo, Carl (Arctic Slope Regional Corp. (ASRC) Federal Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
O'Bryan, Martha (Arctic Slope Regional Corp. (ASRC) Federal Greenbelt, MD, United States)
Date Acquired
May 29, 2018
Publication Date
May 21, 2018
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN56645
GSFC-E-DAA-TN66178
Meeting Information
Meeting: Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
Location: San Diego, CA
Country: United States
Start Date: May 21, 2018
End Date: May 24, 2018
Sponsors: NASA Headquarters
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Single Event Effects (SEE)
NASA Electronic Parts and Packaging (NEPP) Program
Graphics processing unit (GPU)

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