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Dynamically Measuring the Integrity of a Computing ApparatusThe present disclosure includes methods and systems for measuring the integrity of a device. A number of embodiments can include initiating an observatory in a system and initiating a remote manager. A number of embodiments can also include measuring the integrity of the device from the observatory and accessing the integrity measurement of the device from the remote manager.
Document ID
20180004375
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Carpenter, Todd P.
Johnston, Steven J.
De Silva, Ian J.
Date Acquired
August 10, 2018
Publication Date
July 17, 2018
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
Patent Number: US-Patent-10,025,925
Patent Application Number: US-Patent-Appl-SN-14/747,322
Funding Number(s)
CONTRACT_GRANT: FAS750-10-D-0197
CONTRACT_GRANT: W31P4QI3C0I43
CONTRACT_GRANT: NNX15CL71P
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-10,025,925
Patent Application
US-Patent-Appl-SN-14/747,322

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