Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Grogan, Paul T. (Stevens Inst. of Tech. Hoboken, NJ, United States) Dabney, Philip (NASA Goddard Space Flight Center Greenbelt, MD, United States) de Weck, Olivier (Massachusetts Inst. of Technology (MIT) Cambridge, MA, United States) Foreman, Veronica (Massachusetts Inst. of Technology (MIT) Cambridge, MA, United States) Hache, Sigfried (Stevens Inst. of Tech. Hoboken, NJ, United States) Holland, Matthew (NASA Goddard Space Flight Center Greenbelt, MD, United States) Hughes, Steven (NASA Goddard Space Flight Center Greenbelt, MD, United States) Le Moigne, Jacqueline (NASA Goddard Space Flight Center Greenbelt, MD, United States) Nag, Sreeja (Bay Area Environmental Research Inst. Petaluma, CA, United States) Siddiqi, Afreen (Massachusetts Inst. of Technology (MIT) Cambridge, MA, United States) Date Acquired
August 20, 2018
Publication Date
June 13, 2017
Subject Category
Spacecraft Instrumentation And Astrionics Report/Patent Number
GSFC-E-DAA-TN44880GSFC-E-DAA-TN43651Report Number: GSFC-E-DAA-TN44880Report Number: GSFC-E-DAA-TN43651 Meeting Information
Meeting: Geoscience and Remote Sensing symposium (IGRSS)
Location: Fort Wort, TX
Country: United States
Start Date: July 23, 2017
End Date: July 28, 2017
Sponsors: Institute of Electrical and Electronics Engineers, NASA Headquarters
Funding Number(s)
CONTRACT_GRANT: NNX12AD05A
CONTRACT_GRANT: NNX15AU90G
CONTRACT_GRANT: NNX17AE06G
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
Keywords
Pattern RecognitionImage Processing