From Tomography to Material Properties of Thermal Protection Systems

The X-ray micro-tomography technique provides non-destructive characterizations of three-dimensional material micro-structures at spatial resolutions from the sub-micron to the centimeter scale. High quality micro-tomography images of NASA Thermal Protection System (TPS) materials are obtained using one of the brightest synchrotron X-ray sources available. Leveraging on NASA supercomputing capabilities, material properties and response are computed from tomography-data. This talk highlights the process and challenges of going from 3D images of actual material structures to simulations of properties and phenomena relevant to TPS material response, such as thermal conductivity, permeability, mass transport and high temperature reactions. The talk is addressed to a broad audience including scientists, engineers, researchers, educators, programmers, managers, and members of the media.