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Planetary Crater Detection and Registration Using Marked Point Processes, Graph Cut Algorithms, and Wavelet TransformsThis paper addresses the problem of semi-automatic image registration on planetary images. A joint feature-based and area-based approach is proposed. Firstly, the most relevant craters are extracted from the two images to register, and then, registration is performed in two steps. The first step matches the craters extracted from the images based on a generalized Hausdorff distance. In the second step, the mutual information between the two images is maximized to achieve high registration accuracy. Craters are detected by a stochastic-geometry approach based on a marked point process model and of a multiple-birth-and-cut energy minimization algorithm. The experimental validation is carried out with 13 images for the crater extraction stage, and with 20 semi-synthetic pairs of images with ground truth and several images extracted from actual multi-temporal lunar scenes for the registration phase.
Document ID
20190001291
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Gotelli, Alberto
(Genoa Univ. Genoa, Italy)
Le Moigne, Jacqueline
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Moser, Gabriele
(Genoa Univ. Genoa, Italy)
Serpico, Sebastiano
(Genoa Univ. Genoa, Italy)
Date Acquired
March 7, 2019
Publication Date
July 23, 2017
Subject Category
Lunar And Planetary Science And Exploration
Instrumentation And Photography
Report/Patent Number
GSFC-E-DAA-TN42956
Report Number: GSFC-E-DAA-TN42956
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
Keywords
Image Processing; Pattern Recognition
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