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Radiation Single Event Effects (SEE) Impact on Complex Avionics Architecture ReliabilityThe NASA Engineering and Safety Center (NESC) has an urgent need to understand how system-level reliability of an avionics architecture is compromised when portions of the architecture are temporarily unavailable due to single event effects (SEE). The proposed activity parametrically evaluated these SEE impacts on system reliability based on mission duration, upset rate and recovery times for a representative redundant architecture. The key stakeholders for this study are NASA programs and projects that expect to use avionics architectures with electrical, electronic and electromechanical (EEE) parts susceptible to SEE when exposed to the mission expected radiation environment.
Document ID
20190002742
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
Hodson, Robert F.
(NASA Langley Research Center Hampton, VA, United States)
Morgan, Dwayne
(NASA Wallops Flight Facility Wallops Island, VA, United States)
Ladbury, Raymond L.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Chen, Yuan
(NASA Langley Research Center Hampton, VA, United States)
Bay, Michael
(Bay Engineering Innovations, Inc. Edgewater, MD, United States)
Zinchuk, Jeffrey
(Bay Engineering Innovations, Inc. Edgewater, MD, United States)
Date Acquired
April 25, 2019
Publication Date
April 1, 2019
Subject Category
Space Transportation And Safety
Avionics And Aircraft Instrumentation
Report/Patent Number
NASA/TM-2019-220269
NESC-RP-17-01211
L-21015
NF1676L-32877
Funding Number(s)
WBS: 869021.03.07.01.09
Distribution Limits
Public
Copyright
Public Use Permitted.
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