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Zernike Wavefront Sensor (ZWFS) Development for Low Order Wavefront Sensing (LOWFS)ZWFS is known to be photon noise optimal for measuring low order aberrations. Recently, ZWFS was selected as the baseline LOWFS technology on WFIRST for its sensitivity, accuracy, and its ease of integration with the starlight rejection mask. In this paper, we present the development of ZWFS sensor, including the algorithm description, sensitivity analysis, and some early experimental model validation results from a fabricated ZWFS phase mask on a stand-alone LOWFS testbed.
Document ID
20190025618
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Wang, Xu
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Shi, Fang
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Wallace, J. Kent
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
June 3, 2019
Publication Date
June 26, 2016
Subject Category
Astronomy
Report/Patent Number
JPL-CL-16-2760
Report Number: JPL-CL-16-2760
Meeting Information
Meeting: SPIE Astronomical Telescopes + Instrumentation 2016
Location: Edinburgh, Scotland
Country: United Kingdom
Start Date: June 26, 2016
End Date: July 1, 2016
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
Zernike phase contrast
LOWFS
Wavefront sensing
WFIRST

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