Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications

Khreishi, Manal; Ohl, Raymond; Howard, Joseph; Papa, Jonathan; Hovis, Clark; Howe, Andrew; Hadjimichael, Theodore; Thompson, Patrick; Shiri, Ron; West, Garrett; Phenis, Adam; Liang, Rongguang

CMM (Coordinate Measuring Machine) metrology provides simple, 3D (three dimensional) surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.

Document ID

20190025929

Document Type

Conference Paper

Authors

Khreishi, Manal (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Ohl, Raymond (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Howard, Joseph (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Papa, Jonathan (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Hovis, Clark (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Howe, Andrew (Norfolk State Univ. Norfolk, VA, United States)

Hadjimichael, Theodore (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Thompson, Patrick (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Shiri, Ron (NASA Goddard Space Flight Center Greenbelt, MD, United States)

West, Garrett (NASA Goddard Space Flight Center Greenbelt, MD, United States)

Phenis, Adam (Amp Optics, LLC Poway, CA, United States)

Liang, Rongguang (Arizona Univ. Tucson, AZ, United States)

Date Acquired

June 14, 2019

Publication Date

June 10, 2019

Subject Category

Report/Patent Number

Meeting Information

Optical Society of America (OSA) Freeform Optics 2019(Washington, DC)

Funding Number(s)

Distribution Limits

Public

Use by or on behalf of the US Gov. Permitted.

Keywords

Available Downloads

Name

Type

20190025929.pdf

STI

NTRS

NTRS - NASA Technical Reports Server

Available Downloads