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Freeform Surface Characterization and Instrument Alignment for Freeform Space ApplicationsCMM (Coordinate Measuring Machine) metrology provides simple, 3D (three dimensional) surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.
Document ID
20190025929
Document Type
Conference Paper
Authors
Khreishi, Manal (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ohl, Raymond (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Howard, Joseph (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Papa, Jonathan (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Hovis, Clark (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Howe, Andrew (Norfolk State Univ. Norfolk, VA, United States)
Hadjimichael, Theodore (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Thompson, Patrick (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Shiri, Ron (NASA Goddard Space Flight Center Greenbelt, MD, United States)
West, Garrett (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Phenis, Adam (Amp Optics, LLC Poway, CA, United States)
Liang, Rongguang (Arizona Univ. Tucson, AZ, United States)
Date Acquired
June 14, 2019
Publication Date
June 10, 2019
Subject Category
Engineering (General)
Optics
Report/Patent Number
GSFC-E-DAA-TN69408
Meeting Information
Optical Society of America (OSA) Freeform Optics 2019(Washington, DC)
Funding Number(s)
CONTRACT_GRANT: 80GSFC17C0005
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
Keywords
Space Sciences
Astrology
Optical instruments
Optics
Optical systems
Instrumentation
Engineering

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