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Failure Analysis and Products in a Model-Based EnvironmentThe work presented in this paper describes an approach, including a methodology and tools, which allows system engineers to capture failure-related information in a model and generate automatically key failure analysis products: the Failure Modes, Effects and Criticality Analysis (FMECA) and the Fault Tree Analysis (FTA). The work has been developed by Tietronix Software, Inc. and the NASA’s Jet Propulsion Laboratory (JPL), and the resulting auto-generated
artifacts shown in this paper demonstrate the ability to obtain powerful reliability and fault management products in a model-based environment.




Document ID
20190028440
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Castet, Jean-Francois
(Jet Propulsion Laboratory, California Institute of Technology (JPL/CalTech) Pasadena, CA, United States)
Bareh, Magdy
(Jet Propulsion Laboratory, California Institute of Technology (JPL/CalTech) Pasadena, CA, United States)
Nunes, Jeffery
(Jet Propulsion Laboratory, California Institute of Technology (JPL/CalTech) Pasadena, CA, United States)
Okon, Shira
(Tietronix Software, Inc. Houston, TX, United States)
Garner, Larry
(Tietronix Software, Inc. Houston, TX, United States)
Chacko, Emmy
(Tietronix Software, Inc. Houston, TX, United States)
Izygon, Michel
(Tietronix Software, Inc. Houston, TX, United States)
Date Acquired
August 1, 2019
Publication Date
March 3, 2018
Subject Category
Computer Operations And Hardware
Report/Patent Number
JPL-CL-CL#17-6721
Report Number: JPL-CL-CL#17-6721
Meeting Information
Meeting: 2018 IEEE Aerospace Conference
Location: Big Sky, MT
Country: United States
Start Date: March 3, 2018
End Date: March 10, 2018
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other

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