NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
OMH3075 Hall Effect Sensor Total Ionizing Dose Test ReportThe purpose of this test was to characterize the OMH3075 Hall Effects sensor degradation for total dose response. The device samples were exposed to low dose irradiations using gamma radiation. Device parameters such as magnetic operating points, leakage currents, supply currents, and rise and fall times were investigated.




Document ID
20200001205
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Forney, James (Science Systems and Applications, Inc. (SSAI) Lanham, MD, United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
February 27, 2020
Publication Date
August 19, 2019
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN77576
Report Number: GSFC-E-DAA-TN77576
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available