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MapX: an In-Situ Mapping X-Ray Fluorescence Instrument for Detection of Biosignatures and Habitable Planetary EnvironmentsThe search for evidence of life or its processes on other worlds takes on two major themes: the detection of biosignatures indicating extinct or extant life, or the determination that an environment either has or once had the potential to harbor living organisms. In situ elemental imaging is useful in either case, since features on the mm to μm scale reveal geological processes which may indicate past or present habitability. Further, biomineralization can leave traces in the morphology and element distribution of surfaces. The Mapping X-ray Fluorescence Spectrometer (MapX) is an in-situ instrument designed to identify these features on planetary surfaces [1]. Progress on instrument development, data analysis methods, and element quantification are presented.
Document ID
20200001291
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Walroth, R. C.
(Universities Space Research Association (USRA) Moffett Field, CA, United States)
Blake, D. F.
(NASA Ames Research Center Moffett Field, CA, United States)
Sarrazin, P.
(Search for Extraterrestrial Intelligence (SETI) Institute Mountain View, CA, United States)
Marchis, F.
(Search for Extraterrestrial Intelligence (SETI) Institute Mountain View, CA, United States)
Thompson, K.
(Search for Extraterrestrial Intelligence (SETI) Institute Mountain View, CA, United States)
Date Acquired
March 2, 2020
Publication Date
March 18, 2019
Subject Category
Exobiology
Report/Patent Number
ARC-E-DAA-TN66036
Meeting Information
Meeting: Lunar and Planetary Science Conference
Location: The Woodlands, TX
Country: United States
Start Date: March 18, 2019
End Date: March 22, 2019
Sponsors: Lunar and Planetary Institute (LPI), NASA Johnson Space Center
Funding Number(s)
CONTRACT_GRANT: SAA2401923
CONTRACT_GRANT: NNA15BB01A
WBS: 857464.02.01.01
CONTRACT_GRANT: NNH15CO48B
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Professional Review
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