Microwave Photoelasticity: A Resonant Wavelength Approach Applied to PEEK Polymer

Every nondestructive testing (NDT) technique has its unique set of advantages and limitations. Currently, the only existing noncontact NDT method capable of measuring sub-surface stresses, in optically opaque materials, at near-real-time speeds and over large areas is Microwave Photoelasticity (MP). This paper presents a new MP approach, which correlates changes in resonant wavelengths to changes in stress. In addition to a theoretical outline of the approach, the design and operation of an instrument capable of conducting these measurements is described. Finally, the technique is demonstrated by conducting measurements on polyetheretherketone, commonly known as PEEK, polymer. Between the W-Band frequencies of 105 to 115 GHz, PEEK’s stress-optic-coefficient was determined to be of 𝐶𝐶 = −0.20 ± 0.02 1/GPa.