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Single Event Effect Testing of the Texas Instruments' MAX4595 Single-Channel Analog SwitchThe Texas Instruments'™ (TI) MAX4595 was tested for single event latch-up (SEL) response at the Texas A&M University Cyclotron Facility (TAMU) on 26 October 2014. The device was exercised in varied load conditions to replicate its intended application with concerns about destructive effects on the commercial device.
Document ID
20200002147
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Campola, M. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Wilcox, T. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kim, H. (Science Systems and Applications, Inc. (SSAI) Lanham, MD, United States)
Date Acquired
April 2, 2020
Publication Date
October 26, 2014
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN78788
Report Number: GSFC-E-DAA-TN78788
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
single event latch-up (SEL)
single-pole

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