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A Machine Learning Approach to Predict Martensitic Transition Temperatures for Shape Memory AlloysShape memory alloys (SMAs) are a unique class of materials with several remarkable properties including shape recovery, superelasticity, etc. Especially important for many NASA applications is the ability to tune the martensitic phase transition temperature by varying the alloy composition. Nickel-titanium (NiTi) based alloys are the most widely studied of this class, with compositions involving ternary, quaternary, or higher additions being considered. Over the past several years, a significant database of SMA properties has been assembled by NASA researchers. Such a database is ideal for data science-based approaches including machine learning. We present results from a developed machine learning model capable of accurately predicting the transition temperature of SMAs across a wide range of compositions. Our model has the added benefit of interpretability and even provides confidence intervals for our predictions. This model will make rapid screening and design of new SMA materials possible. Predictions from the machine learning model can be validated by empirical and/or atomistic scale modeling.
Document ID
20200011484
Acquisition Source
Ames Research Center
Document Type
Abstract
External Source(s)
Authors
Shreyas Honrao
(Wyle (United States) El Segundo, California, United States)
Othmane Benafan
(Glenn Research Center Cleveland, Ohio, United States)
John Lawson
(Ames Research Center Mountain View, California, United States)
Date Acquired
May 26, 2020
Subject Category
Cybernetics, Artificial Intelligence And Robotics
Report/Patent Number
ARC-E-DAA-TN78583
Report Number: ARC-E-DAA-TN78583
Meeting Information
Meeting: International Materials Applications & Technologies IMAT 2020
Location: Cleveland, OH
Country: US
Start Date: September 14, 2020
End Date: September 17, 2020
Sponsors: ASM International
Funding Number(s)
CONTRACT_GRANT: NNA14AA60C
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
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