Acquisition Source
Langley Research Center
Document Type
Presentation
Authors
Joseph N. Zalameda (Langley Research Center Hampton, Virginia, United States) Wade C. Jackson (Langley Research Center Hampton, Virginia, United States) Date Acquired
April 10, 2020
Subject Category
Instrumentation And Photography Meeting Information
Meeting: SPIE Thermosense
Location: On-one conference
Country: US
Start Date: April 26, 2020
End Date: April 30, 2020
Sponsors: International Society for Optics and Photonics
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
Passive thermographynodestructive evaluationload testing inspectiondamage depththermal model