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Single Event Effect Testing of the Analog Devices ADXL354 3-Axis MEMS AccelerometerThe Analog Devices ADXL354 3-AXIS MEMS accelerometer was tested for single-event effects, both destructive and non-destructive. The device was characterized for single-event upset (SEU) sensitivity and evaluated for any possibility of single-event latchup (SEL), single-event dielectric rupture (SEDR) and single-event functional interrupts (SEFI). Single-event transient (SET) response was also monitored.
Document ID
20205002089
Acquisition Source
Goddard Space Flight Center
Document Type
Other - Test report for posting on Public Web Site
External Source(s)
https://radhome.gsfc.nasa.gov/
Authors
S Stansberry (Science Systems & Applications, Inc. Hampton, VA, USA)
M Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
May 12, 2020
Publication Date
August 24, 2018
Publication Information
Subject Category
Electronics And Electrical Engineering
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
PROJECT: 2018-561-RESTORE
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Single-Event Effect (SEE)
MEMS
Single-Event Upset (SEU)

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