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Reliability Issues with Polymer and MnO2 Tantalum Capacitors for Space ApplicationsThis presentation gives a comparative analysis of degradation processes, failure modes and mechanisms in MnO2 and polymer technology capacitors. Analyzed conditions include effects of vacuum and radiation, soldering (pop-corning), long-term storage, operation at high temperatures, stability at low and high temperatures, and anomalous transients. Screening and qualification procedures to assure space-grade quality of CPTCs are suggested.
Document ID
20205002788
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Alexander Teverovsky
(Jacobs (United States) Dallas, Texas, United States)
Date Acquired
May 27, 2020
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: NCTS #41535-20 --- 2020 NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: US
Start Date: June 15, 2020
End Date: June 18, 2020
Sponsors: Goddard Space Flight Center
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
NASA Peer Committee
Keywords
capacitor
quality assurance
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