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Wide Bandgap Reliability and Application Guidelines
Wide Bandgap (WBG) semiconductors, such as silicon carbide (SiC) and gallium nitride (GaN) have emerged as promising technologies due to the advantages they offer over silicon (Si). Under the NASA Electronic Parts and Packaging (NEPP) Program, Glenn Research Center (GRC) supports a task called "Wide Bandgap Reliability and Application Guidelines." This presentation summarizes the work performed under this task, to be presented at the 2020 NEPP Electronics Technology Workshop in June 2020.
Document ID
20205002797
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Kristen Boomer (Glenn Research Center Cleveland, Ohio, United States)
Ahmad Hammoud (HX5, LLC)
Date Acquired
May 27, 2020
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: NASA Electronic Parts and Packaging Program Electronics Technology Workshop
Location: Greenbelt, MD
Country: US
Start Date: June 15, 2020
End Date: June 18, 2020
Sponsors: Ames Research Center
Funding Number(s)
WBS: 724297.40.49.03.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Wide Bandgap Semiconductors
Power Electronics

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