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Heavy Ion Irradiation Test Report for the Samsung 850 PRO Series Solid State DriveThe purpose of this test was to determine the heavy ion-induced single-event effect (SEE) susceptibility of the Samsung solid state drive (SSD) containing the Vertical-NAND (VNAND) flash technology. This test was supported by the NASA Electronics Parts and Packaging (NEPP) Program.
Document ID
20205003052
Acquisition Source
Goddard Space Flight Center
Document Type
Other - Test report for posting on public website https://radhome.gsfc.nasa.gov/
Authors
Dakai Chen (Goddard Space Flight Center Greenbelt, Maryland, United States)
Carl Szabo (Science Systems and Applications (United States) Lanham, Maryland, United States)
Alyson Topper (Science Systems and Applications (United States) Lanham, Maryland, United States)
Date Acquired
June 2, 2020
Publication Date
October 24, 2014
Publication Information
URL: https://radhome.gsfc.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Solid State Drive (SSD)
MZ7KE256HMHA
single-event functional interrupts (SEFI)

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