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Status of NEPP Radiation Testing 3D NAND FlashThis work provides a current update of radiation testing activities on 3D NAND flash memories in support of the NEPP program. Single-event effects data from heavy-ion and low-energy proton testing is highlighted on a state of the art memory device.
Document ID
20205003346
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Ted Wilcox (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
June 9, 2020
Publication Date
June 17, 2020
Publication Information
URL: https://nepp.nasa.gov/
Subject Category
Space Radiation
Meeting Information
Meeting: 2020 NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: US
Start Date: June 15, 2020
End Date: June 18, 2020
Sponsors: Goddard Space Flight Center
Funding Number(s)
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
Flash
radiation
memory
NAND
proton
heavy ions

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