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Micro Raman Spectroscopy for Characterizing Molecular Contamination on Space Flight HardwareIn the field of contamination control,many unknowns exist. Often, contamination control engineers have to utilize multiple spectroscopic, macroscopic, and microscopic tools to identify contamination sources when there is a potential contamination exposure to space flight hardware. Understanding the chemical composition of the molecular contamination provides an opportunity for contamination control engineers to determine if this contamination is problematic or benign. In this study, an existing witness plate program for monitoring space flight hardware during the assembly, integration, and testing phases is coupled with micro Raman spectroscopy analysis. The main goal of this study is to determine the limitations, reproducibility, and throughput of micro Raman spectroscopy for characterizing molecular contamination. Micro Raman Spectroscopy will be an additional tool used by contamination control engineers to monitor the cleanliness of space flight hardware.
Document ID
20205005870
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Gugu N Rutherford
(Langley Research Center Hampton, Virginia, United States)
Erin Acheson
(Universities Space Research Association Columbia, Maryland, United States)
Date Acquired
August 4, 2020
Publication Date
August 24, 2020
Publication Information
Publication: SPIE Optics + Photonics Digital Forum
Publisher: SPIE
Subject Category
Spacecraft Design, Testing And Performance
Meeting Information
Meeting: SPIE Optics + Photonics Digital Forum
Location: Bellingham, WA
Country: US
Start Date: August 24, 2020
End Date: August 28, 2020
Sponsors: International Society for Optics and Photonics
Funding Number(s)
WBS: 389693.03.07.01
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
Microscope
Raman Spectroscopy
Space Flight Hardware
Contamination Control
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