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A Fast Evaluation of PDA Experimental Parameters Using Mie Scattering to Enhance the Measurement Accuracy of Droplet Size DistributionsThe Phase Doppler technique (PDA) and its implementation generally relies on a geometric optics formulation for light scattering to estimate drop sizes from the measured phase differences between Doppler signals from two or more detectors. Although this limits experimental PDA scattering geometries to those where only one component of the geometric scatter is dominant, the calculations are relatively simple. This TM describes a fast method to evaluate PDA experimental parameters analytically using Mie scattering that provides a performance estimate of all possible configurations. The best configurations are fully tested using a Monte Carlo simulation to obtain a more accurate capability estimate for each one.
Document ID
20205006713
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
James F Meyers
(Langley Research Center (DRA) Hampton, Virginia, United States)
Graham Wigley
(Loughborough University Loughborough, England, United Kingdom)
Date Acquired
August 24, 2020
Publication Date
September 1, 2020
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA/TM-20205006713
Funding Number(s)
WBS: 432938.11.01.07.43.30
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
NASA Technical Management
Keywords
PDA
particle size
mie scattering
monte carlo
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