NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Microsemi PolarFire® Field Programmable Gate Array Single Event Effects Test Report
Document ID
20205007083
Acquisition Source
Goddard Space Flight Center
Document Type
Other - Test report for posting on public website https://nepp.nasa.gov/
Authors
Melanie Berg (Science Systems and Applications (United States) Lanham, Maryland, United States)
Hak Kim (Science Systems and Applications (United States) Lanham, Maryland, United States)
Michael Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Jonathan Pellish (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
September 1, 2020
Publication Date
December 15, 2019
Publication Information
Publication: Public website
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Field Programmable Gate Array (FPGA)
single event effect (SEE)
Single Event Transient (SET)
Single Event Upset (SEU)
single event functional interrupt (SEFI)
single event latch-up (SEL)
single event failure (SEF)

Related Records

There are no records associated with this record.
No Preview Available