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Single-Event Transient Case Study for System-Level Radiation Effects AnalysisAnalog single-event transient results are analyzed for two applications with a system architecture in mind. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation.
Document ID
20205009687
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
M Campola
(Goddard Space Flight Center Greenbelt, Maryland, United States)
R Ladbury
(Goddard Space Flight Center Greenbelt, Maryland, United States)
R Austin
(Goddard Space Flight Center Greenbelt, Maryland, United States)
E Wilcox
(Goddard Space Flight Center Greenbelt, Maryland, United States)
J Pellish
(Goddard Space Flight Center Greenbelt, Maryland, United States)
H Kim
(System Science Applications (United States) Los Angeles, California, United States)
K LaBel
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Date Acquired
November 4, 2020
Publication Date
December 7, 2020
Publication Information
Publication: Presentation only (no video) for posting on public website https://nepp.nasa.gov/
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC), virtual event
Location: Virtual
Country: US
Start Date: November 29, 2020
End Date: December 30, 2020
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: 80NSSC20K0424
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Single-event effects
single-event transients
radiation
system-level effects
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