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Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation
Document ID
20205009744
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Kaitlyn L Ryder
(Vanderbilt University Nashville, Tennessee, United States)
Landen D Ryder
(Vanderbilt University Nashville, Tennessee, United States)
Andrew L Sternberg
(Vanderbilt University Nashville, Tennessee, United States)
John A. Kozub
(Vanderbilt University Nashville, Tennessee, United States)
En Xia Zhang
(Vanderbilt University Nashville, Tennessee, United States)
Stephen D. LaLumondiere
(The Aerospace Corporation El Segundo, California, United States)
Daniele M. Monahan
(The Aerospace Corporation El Segundo, California, United States)
Jeremey P. Bonsall
(The Aerospace Corporation El Segundo, California, United States)
Ani Khachatrian
(United States Naval Research Laboratory Washington D.C., District of Columbia, United States)
Stephen P. Buchner
(United States Naval Research Laboratory Washington D.C., District of Columbia, United States)
Dale McMorrow
(United States Naval Research Laboratory Washington D.C., District of Columbia, United States)
Joel M. Hales
(KeyW Corporation)
Yuanfu Zhao
(Beijing Microelectronics Technology Institute Beijing, China)
Liang Wang
(Beijing Microelectronics Technology Institute Beijing, China)
Chuanmin Wang
(Beijing Microelectronics Technology Institute Beijing, China)
Robert A. Weller
(Vanderbilt University Nashville, Tennessee, United States)
Ronald D. Schrimpf
(Vanderbilt University Nashville, Tennessee, United States)
Sharon M. Weiss
(Vanderbilt University Nashville, Tennessee, United States)
Robert A. Reed
(Vanderbilt University Nashville, Tennessee, United States)
Date Acquired
November 5, 2020
Publication Date
December 1, 2020
Publication Information
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: Virtual
Country: US
Start Date: November 29, 2020
End Date: December 30, 2020
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: 80NSSC20K0424
CONTRACT_GRANT: HDTRA1-16-1-0007
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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