Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Aamir M. Ali (University of California, Berkeley Berkeley, California, United States) Kam Arnold (University of California, San Diego San Diego, California, United States) Jason E. Austermann (National Institute of Standards and Technology Gaithersburg, Maryland, United States) James A. Beall (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Jake Connors (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Shannon M. Duff (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Gene Hilton (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Shuay-Pwu Patty Ho (Stanford University Stanford, California, United States) Johannes Hubmayr (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Bradley R. Johnson (University of Virginia) Yaqiong Li (Cornell University Ithaca, New York, United States) Michael J. Link (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Tammy J. Lucas (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Maximiliano Silva-Feaver (University of California, San Diego San Diego, California, United States) Michael R. Vissers (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Edward J Wollack (Goddard Space Flight Center Greenbelt, Maryland, United States) Date Acquired
January 12, 2021
Publication Date
December 14, 2020
Publication Information
Publication: Proceedings of SPIE: Millimeter, Submillimeter, and Far- Infrared Detectors and Instrumentation for Astronomy X
Publisher: SPIE
Volume: 11453
Meeting Information
Meeting: SPIE Astronomical Telescopes + Instrumentation
Location: Virtual
Country: US
Start Date: December 14, 2020
End Date: December 18, 2020
Sponsors: International Society for Optics and Photonics
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
External Peer Committee