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Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensorsThe Simons Observatory (SO) will perform ground-based observations of the cosmic microwave background (CMB) with several small and large aperture telescopes, each outfitted with thousands to tens of thousands of superconducting aluminum manganese (AlMn) transition-edge sensor bolometers (TESs). In-situ characterization of TES responsivities and effective time constants will be required multiple times each observing-day for calibrating time-streams during CMB map-making. Effective time constants are typically estimated in the field by briefly applying small amplitude square-waves on top of the TES DC biases, and fitting exponential decays in the bolometer response. These so-called “bias step” measurements can be rapidly implemented across entire arrays and therefore are attractive because they take up little observing time. However, individual detector complex impedance measurements, while too slow to implement during observations, can provide a fuller picture of the TES model and a better understanding of its temporal response. Here, we present the results of dark TES
characterization of many prototype SO bolometers and compare the effective thermal time constants measured via bias steps to those derived from complex impedance data.
Document ID
20210000330
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Nicholas F. Cothard
(Cornell University Ithaca, New York, United States)
Aamir M. Ali
(University of California, Berkeley Berkeley, California, United States)
Jason E. Austermann
(National Institute of Standards and Technology Gaithersburg, Maryland, United States)
Steve K. Choi
(Cornell University Ithaca, New York, United States)
Kevin T.Crowley
(Cornell University Ithaca, New York, United States)
Bradley J. Dober
(National Institute of Standards and Technology Gaithersburg, Maryland, United States)
Cody J. Duell
(Cornell University Ithaca, New York, United States)
Shannon M. Duff
(National Institute of Standards and Technology Gaithersburg, Maryland, United States)
Patricio Gallardo
(Cornell University Ithaca, New York, United States)
Gene C. Hilton
(National Institute of Standards and Technology Gaithersburg, Maryland, United States)
Shuay-Pwu Patty Ho
(Stanford University Stanford, California, United States)
Johannes Hubmayr
(National Institute of Standards and Technology Gaithersburg, Maryland, United States)
Michael J. Link
(National Institute of Standards and Technology Gaithersburg, Maryland, United States)
Michael D. Niemack
(Cornell University Ithaca, New York, United States)
Rita F. Sonka
(Princeton University Princeton, New Jersey, United States)
Suzanne T. Staggs
(Princeton University Princeton, New Jersey, United States)
Eve M. Vavagiakis
(Cornell University Ithaca, New York, United States)
Edward J Wollack
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Zhilei Xu
(University of Pennsylvania Philadelphia, Pennsylvania, United States)
Date Acquired
January 12, 2021
Publication Date
December 13, 2020
Publication Information
Publication: Proc. SPIE, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X
Publisher: SPIE
Volume: 11453
URL: see https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11453/1145325/Comparing-complex-impedance-and-bias-step-measurements-of-Simons-Observatory/10.1117/12.2575912.full?SSO=1
Subject Category
Space Radiation
Meeting Information
Meeting: SPIE CONFERENCE
Location: VIRTUAL
Country: US
Start Date: January 25, 2021
End Date: January 28, 2021
Sponsors: SPIE
Funding Number(s)
WBS: 920121.01.05.01.04
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
External Peer Committee
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