Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Nicholas F. Cothard (Cornell University Ithaca, New York, United States) Aamir M. Ali (University of California, Berkeley Berkeley, California, United States) Jason E. Austermann (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Steve K. Choi (Cornell University Ithaca, New York, United States) Kevin T.Crowley (Cornell University Ithaca, New York, United States) Bradley J. Dober (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Cody J. Duell (Cornell University Ithaca, New York, United States) Shannon M. Duff (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Patricio Gallardo (Cornell University Ithaca, New York, United States) Gene C. Hilton (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Shuay-Pwu Patty Ho (Stanford University Stanford, California, United States) Johannes Hubmayr (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Michael J. Link (National Institute of Standards and Technology Gaithersburg, Maryland, United States) Michael D. Niemack (Cornell University Ithaca, New York, United States) Rita F. Sonka (Princeton University Princeton, New Jersey, United States) Suzanne T. Staggs (Princeton University Princeton, New Jersey, United States) Eve M. Vavagiakis (Cornell University Ithaca, New York, United States) Edward J Wollack (Goddard Space Flight Center Greenbelt, Maryland, United States) Zhilei Xu (University of Pennsylvania Philadelphia, Pennsylvania, United States) Date Acquired
January 12, 2021
Publication Date
December 13, 2020
Publication Information
Publication: Proc. SPIE, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X
Publisher: SPIE
Volume: 11453
URL: see https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11453/1145325/Comparing-complex-impedance-and-bias-step-measurements-of-Simons-Observatory/10.1117/12.2575912.full?SSO=1
Meeting Information
Meeting: SPIE CONFERENCE
Location: VIRTUAL
Country: US
Start Date: January 25, 2021
End Date: January 28, 2021
Sponsors: SPIE
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
External Peer Committee