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Functional Variation of Dual Gate MOS-JFET CCD Test StructureDrain voltages of a test structure of dual gate MOS-JFET CCD (TIJ J032) were measured by an advance laser scanner.
Document ID
20210001244
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/33851
Authors
Zakharia, M.
Kim, Q.
Date Acquired
April 4, 1994
Publication Date
April 4, 1994
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
test
structure
dual
gateMOS-JFET
CCD
constant
energy
He-Ne
laser
beam
semiconductor
parameter
analyzer

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