NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Metrology for Spatial InterferometryThe accuracy of the relative metrology gauge developed for the proposed OSI and SONATA missions is improved to sub-picometer level.
Document ID
20210001254
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/35029
Authors
Gursel, Y.
Date Acquired
March 13, 1994
Publication Date
March 13, 1994
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
surface
metrology
gauge

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available