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Degradation of Precision Reference Devices in Space EnvironmentsThis paper presents radiation test results for several different precision voltage devices. Their degradation is compared to that expected for the basic bandgap reference circuit, which is used as a theoretical benchmark, and uses only npn transistorss.
Document ID
20210001305
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/22411
Authors
Johnson, A. H.
Lee, C. I.
Rax, B. G.
Date Acquired
July 4, 1997
Publication Date
July 4, 1997
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
Precision
Voltage
Devices
Radiation
Test
Result

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