A compact 600 GHz electronically tunable vector measurement system for submillimeter wave imaging

A compact submillimeter wave transmission/reflection measurement system has been demonstrated at 560-635 GHz, with electronic tuning over the entire band. Maximum dynamic range measured at a single frequency is 100 dB (60 dB typical), and typical phase noise is less than +/- 1°. By using a frequency steerable lens at the source output and mixer input, the frequency agility of the system can be used to scan the source and receive beams, resulting in near realtime imaging capability using only a single pixel