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Validation of an SEU simulation technique for a complex processor: PowerPC7400Published data on the processors sensitivites with respect to SEU is generally obtained from radiation ground testing during which the program is executed by the DUT consists in the sequential inspection of each of the processor memory cells accessible to the user, through the execution of a suitable instruction sequence. In such programs, so-called static tests, typically considered memory cells are general-purpose registers, special registers (program counter, stack pointer...) and internal memory. Nevertheless, the register use and duty cycle of the final application will be very different, including using instructions no in the static tests and disturbing other potential SEU targets. The ideal would be the use of the final application program for the radiation ground testing, but generally this program is either unknown or unavailable when the qualification testing is performed on candidate circuits to space projects.
Document ID
20210001838
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
Authors
Velazco, R.
Rezgui, S.
Swift, G.M.
Date Acquired
July 15, 2002
Publication Date
July 15, 2002
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
Radiation
single
event
upset
fault
injection
microprocessors

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